Optimal Test Overview
OptimalTest’s Test Management Solutions (TMS) is a comprehensive suite of innovative, integrated software for the semiconductor testing industry. It delivers unprecedented ROI by reducing capital and operational expenditures and improving performance in testing time, utilization, yield, quality and reliability to lower test cost-of- ownership by up to 50%. OptimalTest’s TMS is a one-stop solution...More»
OptimalTest’s Test Management Solutions (TMS) is a comprehensive suite of innovative, integrated software for the semiconductor testing industry. It delivers unprecedented ROI by reducing capital and operational expenditures and improving performance in testing time, utilization, yield, quality and reliability to lower test cost-of- ownership by up to 50%. OptimalTest’s TMS is a one-stop solution that delivers a unique and sustainable competitive advantage It manages the entire testing chain with targeted solutions addressing the needs of all semiconductor companies for all semiconductor devices.
Founded by seasoned management team from the world’s best-known semiconductor companies and by prominent international venture capitalists
Broad multidisciplinary experience
Global capabilities for serving the international semiconductor test industry«Less
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Funding
| Date | Type | Capital Amount | Post-Money Valuation | Investors |
|---|---|---|---|---|
| 12/2007 | Series B | 16M | Unknown |
Products
| Name: | Yield Learning & Reclamation |
| Product URL: | http://www.optimaltest.com/Solutions/Yieldmanagement.aspx |
| Description: | Our Yield Learning & Reclamation solution increases your yields by reclaiming devices wrongly labeled “bad” in real time and off line, and also creates an ongoing baseline for yield learning and device models. It includes a comprehensive set of health monitors across test floors to compare test sites, test cells, products and probe cards to avoid subtle but significant yield losses. In addition, our patented technology for selecting reference dies/units allows you to perform extensive testing for additional yield and reliability learning. |
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01/13/2009 07:47PM by granger
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